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Focused ion beam
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31	PDF Document Add to Reading List Source URL: esref2015.sciencesconf.org Language: English - Date: 2015-03-16 05:41:32 Materials science Microtechnology Survival analysis Semiconductors Reliability engineering Reliability IMEC Focused ion beam Microelectromechanical systems Technology Science Semiconductor device fabrication
32	Revision 1.0 Electron Beam Writing with NPGS SOP This is a shortened version that focuses mainly on routine operation. For more detailed instructions, please refer to the user manual “XL-30” and “Nanometer Pattern Add to Reading List Source URL: www.chemistry.hku.hk Language: English - Date: 2015-05-06 04:34:45 Physics Electron beam lithography Scanning electron microscope Electron microscope Microscopy Electron Focused ion beam Transmission electron microscopy Scientific method Electron microscopy Science
33	Manuscript Title in Title Case Add to Reading List Source URL: www.djs.si Language: English - Date: 2013-11-20 15:39:41 Semiconductor device fabrication Thin film deposition Electron microscopy Ions Materials science Focused ion beam Sputtering Ion beam Flux Chemistry Scientific method Physics
34	PDF Document Add to Reading List Source URL: www.witec.de Language: English - Date: 2014-08-08 08:31:04 Microbiology Microscopy Microscopes Electron microscope Optical microscope Scanning electron microscope Focused ion beam Confocal microscopy Scanning probe microscopy Scientific method Electron microscopy Science
35	Revision 1.0 XL30 ESEM with NPGS SOP This is a shortened version that focuses mainly on routine operation. For more detailed instructions, please refer to the user manual “XL-30” and “Nanometer Pattern Generation Add to Reading List Source URL: www.chemistry.hku.hk Language: English - Date: 2015-05-06 04:34:53 Scanning electron microscope Electron microscope Environmental scanning electron microscope Electron beam lithography Double-click Mouse GUI widget Focused ion beam Scientific method Electron microscopy Science
36	Poster Session – IISC-20 Name Title M. Barr Add to Reading List Source URL: www.flinders.edu.au Language: English - Date: 2014-02-06 19:51:20 Observational astronomy Scattering Spectroscopy Electron microscopy Electron Graphene Low-energy ion scattering Focused ion beam Physics Chemistry Science
37	APPLIED PHYSICS LETTERS VOLUME 81, NUMBER 1 1 JULY 2002 Add to Reading List Source URL: www.princeton.edu Language: English - Date: 2009-09-30 16:05:46 Semiconductor device fabrication Thin film deposition Nanotechnology Analytical chemistry Nanofluidic circuitry Nanoimprint lithography Focused ion beam Sputtering Photolithography Chemistry Materials science Physics
38	Microsoft Word - Exp PhysicsWinter Syllabus.doc Add to Reading List Source URL: www.pdx.edu Language: English - Date: 2013-03-09 14:35:09 Chemistry Scientific method Electron microscopy Focused ion beam Ultra-high vacuum Machining Ion beam Secondary ion mass spectrometry SB Semiconductor device fabrication Thin film deposition Physics
39	Microsoft Word - Syllabus Nanometrology Class 2012 Summer - Erik Sanchez.docx Add to Reading List Source URL: www.pdx.edu Language: English - Date: 2013-03-09 14:37:51 Electron microscopy Physics Science Nanotechnology Focused ion beam Ions Ion beam Fib Nanometrology Semiconductor device fabrication Thin film deposition Scientific method
40	Fraunhofer-Institut für Z u v e r l ä s s i g k e i t u n d M i k r o i n t e g r at i o n I Z M Focused Ion Beam EMV-Messkammer Add to Reading List Source URL: www.izm.fraunhofer.de Language: German - Date: 2015-05-05 17:04:05

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